arXiv· Chaoran Yuan·· 9 天前
FaultGene: LLM-Assisted Fault-Augmented Test Generation for Hardware-in-the-Loop Validation of Autonomous Driving Systems
FaultGene: LLM-Assisted Fault-Augmented Test Generation for Hardware-in-the-Loop Validation of Autonomous Driving Systems
来源：arXiv · arxiv.org